9d ago
Entanglement-Enhanced Quantum Metrology via Alternating In-Phase and Quadrature Modulation
Jihao Ma · Jiahao Huang · Chaohong Lee
Abstract
Author(s): Jihao Ma, Jiahao Huang, and Chaohong Lee<br/><p>Quantum metrology harnesses quantum entanglement to improve measurement precision beyond the standard quantum limit. Although nonlinear interaction is essential for generating entanglement, during signal accumulation, it becomes detrimental and therefore must be suppressed. To address this challenge…</p><br/>[Phys. Rev. Lett. 137, 100801] Published Wed Sep 02, 2026
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